Measuring mixed-signal substrate coupling
نویسندگان
چکیده
A measurement method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper proposes a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements illustrate the performance of the measurement setup.
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ورودعنوان ژورنال:
- IEEE Trans. Instrumentation and Measurement
دوره 50 شماره
صفحات -
تاریخ انتشار 2001